Automated Test Data Generation and Program Analysis
Testing is very important in the development of high-quality software systems. A challenging problem in software testing is the design of a good test suite. In particular, how can we find a small set of test cases so as to achieve certain coverage criteria? In this talk, I shall describe our work on the automatic generation of test data which achieve high statement and branch coverage, as well as basis path coverage, for the unit testing of C programs. The approach is based on symbolic execution and constraint solving techniques. In addition to generating test data, such an analysis can be used to find bugs (like memory leak) directly. Finally, I shall briefly mention our work on test data generation for combinatorial testing, which also uses constraint solving techniques.
Prof. Jian Zhang
Date & Time
18 Jan 2011 (Tuesday) 15:00
Department of Computer and Information Science
Jian Zhang is a research professor with the Institute of Software, Chinese Academy of Sciences (ISCAS). He is also an assistant director of ISCAS. He obtained a PhD in Computer Science from ISCAS in 1994. His main research interests include automated reasoning, constraint solving, program analysis and test data generation. He has served as PC member for more than 40 international conferences (including ICSE, APLAS, COMPSAC, VSTTE, etc.). He also serves on the editorial boards of the Chinese Journal of Computers, Journal of Computer Science and Technology, and Frontiers of Computer Science in China.